Analog / Mixed-Signal Test and Design-for-Test for Integrated Circuits
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Analog / Mixed-Signal Test and Design-for-Test for Integrated Circuits
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Description
The goal of High Tech Institute and its training partners is to both deepen and widen the knowledge and skills of every participant. Nowadays, most products are developed by large teams, combining professionals from all disciplines. This requires them to be experts in their own field and at the same time understand enough of adjacent disciplines. Technical professionals also have to be genuine team players. That’s why we offer several courses on leadership and communication, aimed at working in and leading development teams.
Integrated circuits (ICs) are manufactured by a long sequence of high-precision and hence defectprone processing steps. Each IC must undergo stringent electrical tests to weed out defective parts and guarantee outgoing product quality to the customer. The field of ‘Design-for-Test’ (DfT) focuses in the broad sense on developing economically adequate tests for ICs. The tests must ensure sufficient quality at acceptable test application costs, corresponding to the target application area (e.g., wireless consumer products have less stringent quality requirements, but also different test cost budgets than medical or aerospace products).
Analog and mixed-signal (A/MS) ICs require different teste…
Foire aux questions (FAQ)
Il n'y a pour le moment aucune question fréquente sur ce produit. Si vous avez besoin d'aide ou une question, contactez notre équipe support.
The goal of High Tech Institute and its training partners is to both deepen and widen the knowledge and skills of every participant. Nowadays, most products are developed by large teams, combining professionals from all disciplines. This requires them to be experts in their own field and at the same time understand enough of adjacent disciplines. Technical professionals also have to be genuine team players. That’s why we offer several courses on leadership and communication, aimed at working in and leading development teams.
Integrated circuits (ICs) are manufactured by a long sequence of high-precision and hence defectprone processing steps. Each IC must undergo stringent electrical tests to weed out defective parts and guarantee outgoing product quality to the customer. The field of ‘Design-for-Test’ (DfT) focuses in the broad sense on developing economically adequate tests for ICs. The tests must ensure sufficient quality at acceptable test application costs, corresponding to the target application area (e.g., wireless consumer products have less stringent quality requirements, but also different test cost budgets than medical or aerospace products).
Analog and mixed-signal (A/MS) ICs require different testers than for digital ICs, as well as different DfT techniques, measures of test quality, fault simulation, and test programs. Until quite recently, there has been very little automation to address these differences, mostly due to a lack of standardization in defining analog faults and defects, measuring a test’s coverage, test access to ICs, and DfT circuitry. This course teaches the principles of practical A/MS DfT and test, and the imminent IEEE standards that facilitate systematic solutions now and eventually much more automation.
This course is presented by a world-renowned speaker in the
field with broad scientific and industrial experience:
Stephen Sunter, Engineering Director for Mixed
Signal DfT of Siemens EDA.
His course stands out due to the fact that:
- it is highly practical: combining specification-based and structural tests for manufacturing defects and functional safety
- it has an industry-standard focus: up-to-date details on IEEE P2427 (defect coverage) and P1687.2 (analog IJTAG)
- it is interactive: balanced lectures and Q&A tailor the
content to participants' real challenges.
This training is available for open enrollment as well as for in-company sessions. For in-company sessions, the training can be adapted to your situation and special needs.
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